商品编号


Leica EM RES102



品牌


Leica(徕卡)



公司


Leica



公司分类


Ion Beam Milling Systems


商品信息

Thin, clean, polish, cut slopes and structure your samples with the highest level of flexibility in the
Leica
EM RES102. The unique ion beam milling system combines the preparation of
TEM
,
SEM
and
LM
samples in one single benchtop unit.

A variety of sample holders allows a diverse range of applications to be carried out. In addition to high-energy ion beam milling, the
Leica
EM RES102 can also be used for very gentle sample processing using low ion energy.









Effective and Cost efficient



One system for TEM, SEM and LM applications
SEM preparation of samples up to 25 mm diameter
Improved effectiveness in TEM sample preparation with the production of large electron transparent areas for TEM analysis
LAN cap
ABI
lity for remote control and monitoring











Safe



Fully program controlled motorized ion source and sample movements for reproduc
IBL
e results













Native specimens



LN2 sample stage cooling to maintain the integrity of temperature sensitive samples











Easy operation



Integrated applications library?
Integrated helpfiles and tutorial videos for beginners and maintenance