商品编号


Leica EM TXP | Target Preparation Device



品牌


Leica(徕卡)



公司


Leica



公司分类


Ion Beam Milling Systems



商品信息

The
Leica
EM TXP is a
target preparation device
for
milling, sawing, grinding
, and
polishing
samples prior to examination by
SEM, TEM
, and
LM
techniques.

An integrated stereomicroscope allows pinpointing and easy preparation of barely vis
IBL
e targets.

With the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an
eyepiece graticule
.









Integrated automatic process control



Integrated process control with automatic E-W guiding mechanism, force-regulated feed control and countdown function saves the user from time-consuming routine sample preparation.











Surface finish and target examination



Surface finish and target examination with the integrated stereomicroscope means that the user does not have to transfer the sample for distance estimation and surface evaluation, which increases user efficiency.














Variety of tool inserts



Variety of tool inserts allows the specimen to be milled, sawed, drilled, ground and polished without sample removal from the instrument. The
ABI
lity to observe the process through the stereomicroscope results in time and cost savings.












Inspection of Multilayer Samples



Workflow in Quality Control: Combining the target surfacing system
Leica
EM TXP and the light microscope
Leica
DM2700 M allows to reduce the required procedure, streamline the workflow and produce reliable and precise results.